<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="6.x">Drupal-Biblio</source-app><ref-type>17</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Martin, Y.</style></author><author><style face="normal" font="default" size="100%">Williams, C. C.</style></author><author><style face="normal" font="default" size="100%">Wickramasinghe, H. K.</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Atomic force microscope–force mapping and profiling on a sub 100Å scale</style></title><secondary-title><style face="normal" font="default" size="100%">Journal of Applied Physics</style></secondary-title><short-title><style face="normal" font="default" size="100%">J. Appl. Phys.</style></short-title></titles><dates><year><style  face="normal" font="default" size="100%">1987</style></year><pub-dates><date><style  face="normal" font="default" size="100%">01/1987</style></date></pub-dates></dates><volume><style face="normal" font="default" size="100%">61</style></volume><pages><style face="normal" font="default" size="100%">4723</style></pages><abstract><style face="normal" font="default" size="100%">&lt;p&gt;A modified version of the atomic force microscope is introduced that enables a precise measurement of the force between a tip and a sample over a tip‐sample distance range of 30&amp;ndash;150&amp;Aring;. As an application, the force signal is used to maintain the tip‐sample spacing constant, so that profiling can be achieved with a spatial resolution of 50&amp;Aring;. A second scheme allows the simultaneous measurement of force and surface profile; this scheme has been used to obtain material‐dependent information from surfaces of electronic materials.&lt;/p&gt;
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