@article {84,
	title = {Atomic Force Microscope},
	journal = {Physical Review Letters},
	volume = {56},
	year = {1986},
	month = {03/1986},
	pages = {930 - 933},
	abstract = {<p>The scanning tunneling microscope is proposed as a method to measure forces as small as 10<sup>-18</sup> N. As one application for this concept, we introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale. The atomic force microscope is a combination of the principles of the scanning tunneling microscope and the stylus profilometer. It incorporates a probe that does not damage the surface. Our preliminary results in air demonstrate a lateral resolution of 30\&Aring; and a vertical resolution less than 1\&Aring;.</p>
},
	issn = {0031-9007},
	doi = {10.1103/PhysRevLett.56.930},
	author = {Binnig, Greg and Quate, Calvin F. and Gerber, Christoph}
}
