@article {157, title = {Puckering Stick-Slip Friction Induced by a Sliding Nanoscale Contact}, journal = {Physical Review Letters}, volume = {111}, year = {2013}, month = {8/2013}, abstract = {

An atomic force microscope reveals that the sliding of a nanotip on a graphite surface occurs through a nanoscale stick-slip mechanism. The angle between the sliding direction and a stiff crystallographic axis determines the periodicity of the slip events defining domains of various friction properties. The experimental data are interpreted using the reaction rate theory, with the energy barrier driven by a local deformation of the surface and a thermally activated relaxation.

}, issn = {1079-7114}, doi = {10.1103/PhysRevLett.111.084301}, author = {Rastei, M. V. and Heinrich, B. and Gallani, J. L.} } @article {94, title = {Graphite, graphene on SiC, and graphene nanoribbons: Calculated images with a numerical FM-AFM}, journal = {Beilstein Journal of Nanotechnology}, volume = {3}, year = {2012}, month = {2012}, pages = {301 - 311}, abstract = {

Background: Characterization at the atomic scale is becoming an achievable task for FM-AFM users equipped, for example, with a qPlus sensor. Nevertheless, calculations are necessary to fully interpret experimental images in some specific cases. In this context, we developed a numerical AFM (n-AFM) able to be used in different modes and under different usage conditions.

Results: Here, we tackled FM-AFM image calculations of three types of graphitic structures, namely a graphite surface, a graphene sheet on a silicon carbide substrate with a Si-terminated surface, and finally, a graphene nanoribbon. We compared static structures, meaning that all the tip and sample atoms are kept frozen in their equilibrium position, with dynamic systems, obtained with a molecular dynamics module allowing all the atoms to move freely during the probe oscillations.

Conclusion: We found a very good agreement with experimental graphite and graphene images. The imaging process for the deposited nanoribbon demonstrates the stability of our n-AFM to image a non-perfectly planar substrate exhibiting a geometrical step as well as a material step.

}, doi = {10.3762/bjnano.3.34}, author = {Castani{\'e}, Fabien and Nony, Laurent and Gauthier, S{\'e}bastien and Bouju, Xavier} } @book {87, title = {Life at the Nanoscale: Atomic Force Microscopy of Live Cells}, year = {2011}, abstract = {

This timely book provides a comprehensive overview of the use of AFM and related scanning probe microscopies for cell surface analysis, going from the basics to the applications side. It covers all cell types, going from viruses and protoplasts to bacteria and animal cells and to discuss a range of advanced AFM modalities, including high-resolution imaging, nanoindentation measurements, recognition imaging, and single-molecule and single-cell force spectroscopy. The book covers methodologies for preparing and analyzing cells and membranes of all kinds and highlights recent examples to illustrate the power of AFM techniques in life sciences and nanomedicine.

}, isbn = {978-9814267960}, url = {http://www.amazon.com/Life-Nanoscale-Atomic-Force-Microscopy/dp/9814267961}, author = {Dufrene, Yves} } @book {100, title = {Advanced Techniques and Applications on Scanning Probe Microscopy}, series = {Applied Physics Review Books}, year = {2008}, publisher = {Research Signpost}, organization = {Research Signpost}, abstract = {

Since its invention in the last 80th, the scanning probe microscopy (SPM) is continuously developing in its techniques and applications. Now SPM family such as scanning tunnelling microscopy (STM), atomic force microscopy (AFM), scanning near-field optical microscopy (SNOM) and scanning thermal microscopy (SThM) has became an indispensable tool for the investigation and manipulation of matter at the nanometer-scale in many scientific disciplines: surface science, surface chemistry, electrochemistry, materials science, optics, biology and geology etc. Locally imaging and probing surfaces of metals, semiconductors or insulators on the atomic resolution by STM and AFM is nowadays a routine in most of the laboratories in the world. By changing the nature of the probe-sample interaction and signal detection mechanism, SPM techniques such as AFM, SNOM, SThM \… have greatly expanded applications in physics, chemistry and biology, especially in life sciences. Today making an overview of all SPM techniques and applications in one book is almost impossible. The papers in the present issue describe recent progress on SPM development including the treatment of the theoretical and experimental techniques, the design and instrumentation of practical SPM instruments and the applications of these techniques in different fields. We are very grateful to all our colleagues who took the efforts to prepare manuscripts and provided them in timely manner. Their activity will help scientists in research and development fields to be informed about the latest achievements in scanning probe methods.

}, isbn = {9788178953786}, author = {Bubendorff, Jean-Luc and Lei, F.H.} } @book {86, title = {Les nouvelles microscopies : A la d{\'e}couverte du nanomonde}, year = {2006}, abstract = {

L\&$\#$39;\ère des nouvelles microscopies a d\ébut\é avec fracas il y maintenant vingt-cinq ans, avec l\&$\#$39;invention du microscope \à effet tunnel (ou STM). Ce formidable instrument, qui permettait pour la premi\ère fois de \" voir \" les atomes et les mol\écules, a en effet inaugur\é la famille des microscopes \à sondes locales, o\ù un capteur miniature se d\éplace \à tr\ès faible distance de la surface \à analyser. Le microscope \à force atomique (AFM), les microscopes thermique et optique en champ proche (SNOM) ont bient\ôt suivi : ce sont des
outils incontournables de nos jours, dans les laboratoires comme dans l\&$\#$39;industrie, pour qui veut partir \à la d\écouverte du nanomonde et sonder voire manipuler la mati\ère \à ces \échelles. Si une litt\érature tr\ès sp\écialis\ée existe sur telle ou telle sonde, aucun trait\é n\&$\#$39;offrait un panorama exhaustif de ces nouvelles microscopies : c\&$\#$39;est dire l\&$\#$39;importance du pr\ésent ouvrage qui d\étaille avec une grande clart\é leur fonctionnement et les principes
physiques sous-jacents, d\&$\#$39;une profonde unit\é. Con\çu pour \être accessible d\ès l\&$\#$39;entr\ée en master, le livre fourmille \également de conseils pratiques sur ces instruments. Il propose enfin une synth\èse in\édite sur leurs innombrables applications en physique des mat\ériaux et des surfaces, en \électronique et en biologie.

}, isbn = {978-2701136486}, url = {http://www.amazon.fr/Les-nouvelles-microscopies-d{\'e}couverte-nanomonde/dp/2701136482/ref=sr_1_1?ie=UTF8\&qid=1332766476\&sr=8-1}, author = {Aigouy, Lionel and De Wilde, Yannick and Fr{\'e}tigny, Christian} } @article {Butt-2005, title = {Force measurements with the atomic force microscope: Technique, interpretation and applications}, journal = {Surface Science Reports}, volume = {59}, number = {1-6}, year = {2005}, month = {2005}, pages = {1{\textendash}152}, abstract = {

The atomic force microscope (AFM) is not only a tool to image the topography of solid surfaces at high resolution. It can also be used to measure force-versus-distance curves. Such curves, briefly called force curves, provide valuable information on local material properties such as elasticity, hardness, Hamaker constant, adhesion and surface charge densities. For this reason the measurement of force curves has become essential in different fields of research such as surface science, materials engineering, and biology. Another application is the analysis of surface forces per se. Some of the most fundamental questions in colloid and surface science can be addressed directly with the AFM: What are the interactions between particles in a liquid? How can a dispersion be stabilized? How do surfaces in general and particles in particular adhere to each other? Particles and surfaces interactions have major implications for friction and lubrication. Force measurements on single molecules involving the rupture of single chemical bonds and the stretching of polymer chains have almost become routine. The structure and properties of confined liquids can be addressed since force measurements provide information on the energy of a confined liquid film. After the review of Cappella [B. Cappella, G. Dietler, Surf. Sci. Rep. 34 (1999) 1-104] 6 years of intense development have occurred. In 1999, the AFM was used only by experts to do force measurements. Now, force curves are used by many AFM researchers to characterize materials and single molecules. The technique and our understanding of surface forces has reached a new level of maturity. In this review we describe the technique of AFM force measurements. Important experimental issues such as the determination of the spring constant and of the tip radius are discussed. Current state of the art in analyzing force curves obtained under different conditions is presented. Possibilities, perspectives but also open questions and limitations are discussed.

}, keywords = {Atomic force microscope, Force curves, Surface forces}, doi = {10.1016/j.surfrep.2005.08.003}, url = {http://www.sciencedirect.com/science/article/B6TVY-4HG6H74-1/2/25cdf11a33a8bedb2599da5061b9b5dd}, author = {Butt, Hans-Jurgen and Cappella, Brunero and Kappl, Michael} } @article {82, title = {Dynamic atomic force microscopy methods}, journal = {Surface Science Reports}, volume = {47}, year = {2002}, month = {09/2002}, pages = {197 - 301}, abstract = {

In this report we review the fundamentals, applications and future tendencies of dynamic atomic force microscopy (AFM) methods. Our focus is on understanding why the changes observed in the dynamic properties of a vibrating tip that interacts with a surface make possible to obtain molecular resolution images of membrane proteins in aqueous solutions or to resolve atomic-scale surface defects in ultra high vacuum (UHV). Our description of the two major dynamic AFM modes, amplitude modulation atomic force microscopy (AM-AFM) and frequency modulation atomic force microscopy (FM-AFM) emphasises their common points without ignoring the differences in experimental set-ups and operating conditions. Those differences are introduced by the different feedback parameters, oscillation amplitude in AM-AFM and frequency shift and excitation amplitude in FM-AFM, used to track the topography and composition of a surface.

The theoretical analysis of AM-AFM (also known as tapping-mode) emphasises the coexistence, in many situations of interests, of two stable oscillation states, a low and high amplitude solution. The coexistence of those oscillation states is a consequence of the presence of attractive and repulsive components in the interaction force and their non-linear dependence on the tip\–surface separation. We show that key relevant experimental properties such as the lateral resolution, image contrast and sample deformation are highly dependent on the oscillation state chosen to operate the instrument. AM-AFM allows to obtain simultaneous topographic and compositional contrast in heterogeneous samples by recording the phase angle difference between the external excitation and the tip motion (phase imaging). Significant applications of AM-AFM such as high-resolution imaging of biomolecules and polymers, large-scale patterning of silicon surfaces, manipulation of single nanoparticles or the fabrication of single electron devices are also reviewed.

FM-AFM (also called non-contact AFM\—NC-AFM) has achieved the long-standing goal of true atomic resolution with AFM in UHV. Our analysis starts with a discussion of the relation between frequency shifts and tip\–surface interactions, emphasising the ability of perturbation theory to describe the measured frequency shift. We discuss the role of short-range chemical interactions in the atomic contrast, with particular attention to semiconductor and ionic (alkali halides and oxides) surfaces. Also included is a detailed quantitative comparison between theoretical simulations and experiment. Inversion procedures, the determination of the tip\–sample interaction from the frequency shift versus distance curves above specific sites, are also reviewed. We finish with a discussion of the optimal range of experimental operation parameters, and the use of damping (excitation amplitude) as a source of atomic contrast, including the possible interpretation in terms of microscopic dissipation mechanisms.

}, issn = {01675729}, doi = {10.1016/S0167-5729(02)00077-8}, author = {Garc{\'\i}a, Ricardo and P{\'e}rez, Rub{\'e}n} } @article {83, title = {Unifying theory of tapping-mode atomic-force microscopy}, journal = {Physical Review B}, volume = {66}, year = {2002}, month = {07/2002}, abstract = {

We propose a general method for describing tapping-mode atomic-force microscopy. The combined participation of attractive and repulsive interactions determines the multivalued nature of the resonance curve. This, in turn, implies the coexistence of two different stable oscillations for some excitation frequencies. The coexistence of two stable oscillations depends on the driving force and tip-surface separation. Increasing the driving force inhibits the low-amplitude oscillation state. Because resolution depends on the oscillation state, we propose that the absence of the low amplitude solution is responsible for the inconsistencies observed in high-resolution imaging of biomolecules.

}, issn = {1095-3795}, doi = {10.1103/PhysRevB.66.041406}, author = {San Paulo, {\'A}lvaro and Garc{\'\i}a, Ricardo} } @article {85, title = {Atomic force microscope{\textendash}force mapping and profiling on a sub 100{\r A} scale}, journal = {Journal of Applied Physics}, volume = {61}, year = {1987}, month = {01/1987}, pages = {4723}, abstract = {

A modified version of the atomic force microscope is introduced that enables a precise measurement of the force between a tip and a sample over a tip-sample distance range of 30\–150\Å. As an application, the force signal is used to maintain the tip-sample spacing constant, so that profiling can be achieved with a spatial resolution of 50\Å. A second scheme allows the simultaneous measurement of force and surface profile; this scheme has been used to obtain material-dependent information from surfaces of electronic materials.

}, issn = {00218979}, doi = {10.1063/1.338807}, author = {Martin, Y. and Williams, C. C. and Wickramasinghe, H. K.} } @article {84, title = {Atomic Force Microscope}, journal = {Physical Review Letters}, volume = {56}, year = {1986}, month = {03/1986}, pages = {930 - 933}, abstract = {

The scanning tunneling microscope is proposed as a method to measure forces as small as 10-18 N. As one application for this concept, we introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale. The atomic force microscope is a combination of the principles of the scanning tunneling microscope and the stylus profilometer. It incorporates a probe that does not damage the surface. Our preliminary results in air demonstrate a lateral resolution of 30\Å and a vertical resolution less than 1\Å.

}, issn = {0031-9007}, doi = {10.1103/PhysRevLett.56.930}, author = {Binnig, Greg and Quate, Calvin F. and Gerber, Christoph} }